Pages: 21-28

Authors: Nenad M. Kartalović , Uroš D. Kovačević, Dušan P. Nikezić, and Predrag V. Osmokrović

Abstract

The miniaturization of computer facilities conditioned by the miniaturization of applied components makes them very sensitive to radioactive radiation. This is where neutron and electromagnetic radiation come to the fore. The reason for the particularly pronounced effects of this radiation is the fact that they do not interact with the Coulomb force, so they pass (leave) the reactor vessel unimpeded. This study examines the reliability of magnetic and semiconductor computer memories in the field of neutron and gamma radiation. This study experimental, and conducted under well-controlled conditions. The combined measurement uncertainty of the experimental procedure is less than 5 %. Sophisticated methods of mathematical statistics were used to process the stochastic results of measurements.

Key words: operational reliability, neutron radiation, gamma radiation, magnetic memory, semiconductor memory

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