Nuclear Technology & Radiation Protection Journal


NT & RP Journal	THE METHODOLOGY FOR ACTIVE TESTING OF ELECTRONIC DEVICES UNDER THE RADIATIONS
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Vol. XXXIII, No. 1, Pp. 1-138 March 2018 UDC 621.039+614.876:504.06 ISSN 1451-3994 Back to Contents	Pages: 53-60 Authors: Aldo Parlato, Elio A. Tomarchio, Cristiano Calligaro, and Calogero Pace Abstract The methodology, developed for active testing of electronic devices under the radiations, is presented. The test set-up includes a gamma-ray facility, the hardware board/fixtures and the software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for static random access memory modules are reported. Key words: testing methodology, electronic device, total ionizing dose, single event effect, gamma ray FULL PAPER IN PDF FORMAT (1.16 MB)
Vinča Institute of Nuclear Sciences :: Designed by milas :: July 2007 Operated by acapanic :: Last updated on June, 2018

Pages: 53-60

Authors: Aldo Parlato, Elio A. Tomarchio, Cristiano Calligaro, and Calogero Pace

Abstract

The methodology, developed for active testing of electronic devices under the radiations, is presented. The test set-up includes a gamma-ray facility, the hardware board/fixtures and the software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for static random access memory modules are reported.

Key words: testing methodology, electronic device, total ionizing dose, single event effect,
gamma ray

FULL PAPER IN PDF FORMAT (1.16 MB)