Pages: 256-260

Authors: Siming Guo, Jinjie Wu, Haiyan Du, Jian Zhang, Xufang Li, Congzhan Liu, Shuai  Zhang, Chengze Li, Binbin Huo, Zhenyu Liao, and Ying Liu

Abstract

The temperature of the working environment is one of the key factors in determining the properties of semiconductor detectors, and it affects the absolute accuracy and stability of the standard detector. In order to determine the temperature coefficient of CdTe detector used for X-rays detection, a precise temperature control system was designed. In this experiment, detectors and radiographic source were set inside a thermostat with temperature of 0~40 °C, so that the temperature can be regulated for the test of the temperature coefficient of CdTe detector. Studies had shown that, with the increase of the temperature, the energy resolution and detection efficiency of the CdTe detector would deteriorate, and under 10 °C the detectors have better performance with the 8 keV X-rays.

Key words: CdTe detector, temperature coefficient, X-ray, detection efficiency, energy resolution

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