Vol.
XXV, No. 1, Pp. 1-68
April 2010
UDC 621.039+614.876:504.06
ISSN 1451-3994
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Pages: 8-12
Authors: Anton Yu. Teterin,
Mikhail V. Ryzhkov, Yury
A. Teterin, Ernst Z. Kumaev, Konstantin I. Maslakov, Kirill
E. Ivanov, Victor V. Fedorenko, Lyudmila V. Elohina
Abstract
The structure of the X-ray photoelectron, X-ray O(F)Ka-emission
spectra from ThO2 and ThF4 as well as the Auger OKLL spectra from
ThO2 was studied. The spectral structure was analyzed by using fully
relativistic cluster discrete variational calculations of the electronic
structure of the ThO812–(D4h) and ThF84–(C2) clusters reflecting
thorium close environment in solid ThO2 and ThF4. As a result it
was theoretically found and experimentally confirmed that during
the chemical bond formation the filled O(F)2p electronic states
are distributed mainly in the binding energy range of the outer
valence molecular orbitals from 0-13 eV, while the filled O(F)2s
electronic states – in the binding energy range of the inner valence
molecular orbitals from 13-35 eV. It was shown that the Auger OKLL
spectral structure from ThO2 characterizes not only the O2p electronic
state density distribution, but also the O2s electronic state density
distribution. It agrees with the suggestion that O2s electrons participate
in formation of the inner valence molecular orbitals, in the binding
energy range of 13-35 eV. The relative Auger OKL2-3L2-3 peak intensity
was shown to reflect quantitatively the O2p electronic state density
of the oxygen ion in ThO2.
Key words:
X-ray photoelectron spectra, thorium oxide, thorium tetrafluoride,
outer and inner valence molecular orbitals
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