XXXIII, No. 1, Pp. 1-138
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Authors: Aldo Parlato, Elio A. Tomarchio, Cristiano Calligaro, and Calogero Pace
The methodology, developed for active testing of electronic devices under the radiations, is presented. The test set-up includes a gamma-ray facility, the hardware board/fixtures and the software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for static random access memory modules are reported.
testing methodology, electronic device, total ionizing dose, single event effect,
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